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DS1822
data from the DS1822 is valid for 15 μ s after the falling edge that initiated the read time slot. Therefore,
the master must release the bus and then sample the bus state within 15 μ s from the start of the slot.
Figure 15 illustrates that the sum of T INIT , T RC , and T SAMPLE must be less than 15 μ s for a read time slot.
Figure 16 shows that system timing margin is maximized by keeping T INIT and T RC as short as possible
and by locating the master sample time during read time slots towards the end of the 15 μ s period.
DETAILED MASTER READ 1 TIMING Figure 15
V PU
1-WIRE BUS
GND
VIH of Master
T INT > 1 μ s
T RC
Master samples
15 μ s
RECOMMENDED MASTER READ 1 TIMING Figure 16
V PU
1-WIRE BUS
GND
VIH of Master
T INT = T RC =
small small
15 μ s
Master samples
LINE TYPE LEGEND
Bus master pulling low
Resistor pullup
RELATED APPLICATION NOTES
The following Application Notes can be applied to the DS1822. These notes can be obtained from the
Dallas Semiconductor “Application Note Book,” via the Dallas website at http://www.dalsemi.com/ , or
through our faxback service at (214) 450–0441.
Application Note 27: Understanding and Using Cyclic Redundancy Checks with Dallas Semiconductor
Touch Memory Product
Application Note 55: Extending the Contact Range of Touch Memories
Application Note 74: Reading and Writing Touch Memories via Serial Interfaces
Application Note 104: Minimalist Temperature Control Demo
Application Note 106: Complex MicroLANs
Application Note 108: MicroLAN—In the Long Run
Application Note 162: Interfacing the DS18X20/DS1822 1-Wire Temperature Sensor in a
Microcontroller Environment
Sample 1-Wire subroutines that can be used in conjunction with AN74 can be downloaded from the
Dallas website or anonymous FTP Site.
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